131679A-01L
National Instruments
131679A-01L
National Instruments
Description
The 131679A-01L Semiconductor Test System, also known as STS T1M2 SOM Set, is a crucial component designed for testing semiconductor devices with optimal performance and accuracy. Specifically tailored for modern semiconductor testing processes, this system guarantees efficient and accurate testing capabilities for research, development, and manufacturing applications.
Made By | National Instruments |
---|---|
Part Number | 131679A-01L |
Product Type | Semiconductor Test System |
Product Line | STS T1M2 SOM Set |
Model | 131679A-01L |
Distribution Cache Shipping Info and Options
Shipping Carriers: Here at Distribution Cache we ship using UPS, FedEx, DHL, or TNT. In most cases we get very competitive rates based on our volume and will be happy quote shipping cost to your location upon request. We also know that many customers would prefer to ship collect on their own account numbers and welcome this option.
Shipping Blind: We recognize that many of our customers intend to re-sell the product to their end user. We respect our customer’s relationships with their clients and offer blind shipping as an option to ensure that the package arrives in the most clandestine way possible.
Shipping Process: We take pride in the way we package your order and spare no cost in making sure that it arrives safely at your facility. In the case of new parts, we are always sure to package the factory box inside another larger box for safe transit. For reconditioned parts we often use Distribution Cache customized packaging that is specially made to protect the products from the bumps and falls present during shipment.
Shipping Options:
Next Day Air Early AM - This service is the fastest overnight delivery option available. For most locations the package will be guaranteed by 8:30AM.
Next Day Air – This service guarantees delivery by 10:30AM and is the most frequently used option for overnight shipments.
Next Day Air Saver – This cost saving overnight alternative guarantees delivery by 3PM the next day.
2nd Day Air – For domestic shipments that would take 3-5 days if shipped via Ground, sometimes having the order in 2 days is a great way to go
Ground – Ground is the most inexpensive shipping option provided. Please ask if we are doing a “free domestic ground” shipping promotion on your order. We often provide free ground shipping on larger orders.
Emergency Courier – At times we can help work with a courier service to get the part to your facility during downtimes scenarios. We prefer that the customer sets up the courier but we can be there to make sure the product is handed off to the driver. Please give us a call to see if this is an option on your order.
Please Note: Products listed as “ships today” can ship same-day if an order is placed before 4PM. For larger drives and motors we ask that notification for same-day shipments be provided by 2PM at the latest. For any products listed as “ships in 3-5 days”, please give us a call to see if this can be expedited.
Question:
What is the 131679A-01L Semiconductor Test System also known as?
Answer:
The 131679A-01L Semiconductor Test System is also known as STS T1M2 SOM Set.
Question:
What is the purpose of the 131679A-01L Semiconductor Test System?
Answer:
The purpose of the 131679A-01L Semiconductor Test System is to test semiconductor devices, ensuring reliable testing results for various semiconductor applications.
Question:
What are the key characteristics of the STS T1M2 model?
Answer:
The STS T1M2 model is designed for optimal performance and accuracy, tailored to meet the demands of modern semiconductor testing processes with advanced features and precision engineering.
Question:
What types of environments is the 131679A-01L Semiconductor Test System suitable for?
Answer:
The 131679A-01L Semiconductor Test System is suitable for both research and development purposes and manufacturing settings.
Question:
What does the 131679A-01L guarantee for semiconductor testing?
Answer:
The 131679A-01L guarantees efficient and accurate testing capabilities for semiconductor testing.