PXIe-6570
National Instruments
PXIe-6570
National Instruments
Description
The PXIe-6570 is a high-performance digital pattern instrument used for semiconductor testing, featuring extensive tools for creating, managing, and analyzing digital test patterns. With compatibility with existing systems and a flexible design, it provides a reliable solution for precise and efficient testing in the semiconductor industry.
The PXIe-6570 is a digital pattern instrument manufactured by National Instruments. It is designed for semiconductor portrayal and production tests, offering a high performance of 100 MVector/s. This instrument is commonly used in the semiconductor industry for precise and efficient testing processes. The part number for the PXIe-6570 is 785283-01. This unique identifier allows customers to easily identify and order the specific instrument they need. National Instruments ensures that each instrument is labeled with a part number, ensuring accuracy and ease of use for their customers. One of the standout features of the PXIe-6570 is its extensive set of included tools. These tools enhance user experience and provide valuable insights during tests. The digital pattern editor allows users to easily create, modify, and manage digital test patterns. The Shmoo tool is used for characterizing and analyzing the performance of a device using multiple measurements. The digital scope provides a visual representation of the signal waveforms. Additional viewers are available for History RAM, pin states, and framework states, providing important data during testing. The PXIe-6570 is compatible with the NI PXI platform and the NI Semiconductor Test System (STS). This ensures seamless integration with existing systems, reducing the need for additional equipment and saving resources. National Instruments has designed the PXIe-6570 to be flexible and adaptable to different testing environments, making it a versatile and reliable option for semiconductor testing needs. Overall, the PXIe-6570 offers a powerful and efficient solution for digital pattern testing in the semiconductor industry.
| Made By | National Instruments |
|---|---|
| Model Number | PXIe-6570 |
| Part Number | 785283-01 |
| Function | 100 MVector/s Digital Pattern Instrument for semiconductor portrayal and production tests |
| Included Tools | Digital Pattern Editor, Shmoo, digital scope, viewers for History RAM, pin states, and framework sta |
| Compatibility | NI PXI platform and NI Semiconductor Test System (STS) |
Distribution Cache Shipping Info and Options
Shipping Carriers: Here at Distribution Cache we ship using UPS, FedEx, DHL, or TNT. In most cases we get very competitive rates based on our volume and will be happy quote shipping cost to your location upon request. We also know that many customers would prefer to ship collect on their own account numbers and welcome this option.
Shipping Blind: We recognize that many of our customers intend to re-sell the product to their end user. We respect our customer’s relationships with their clients and offer blind shipping as an option to ensure that the package arrives in the most clandestine way possible.
Shipping Process: We take pride in the way we package your order and spare no cost in making sure that it arrives safely at your facility. In the case of new parts, we are always sure to package the factory box inside another larger box for safe transit. For reconditioned parts we often use Distribution Cache customized packaging that is specially made to protect the products from the bumps and falls present during shipment.
Shipping Options:
Next Day Air Early AM - This service is the fastest overnight delivery option available. For most locations the package will be guaranteed by 8:30AM.
Next Day Air – This service guarantees delivery by 10:30AM and is the most frequently used option for overnight shipments.
Next Day Air Saver – This cost saving overnight alternative guarantees delivery by 3PM the next day.
2nd Day Air – For domestic shipments that would take 3-5 days if shipped via Ground, sometimes having the order in 2 days is a great way to go
Ground – Ground is the most inexpensive shipping option provided. Please ask if we are doing a “free domestic ground” shipping promotion on your order. We often provide free ground shipping on larger orders.
Emergency Courier – At times we can help work with a courier service to get the part to your facility during downtimes scenarios. We prefer that the customer sets up the courier but we can be there to make sure the product is handed off to the driver. Please give us a call to see if this is an option on your order.
Please Note: Products listed as “ships today” can ship same-day if an order is placed before 4PM. For larger drives and motors we ask that notification for same-day shipments be provided by 2PM at the latest. For any products listed as “ships in 3-5 days”, please give us a call to see if this can be expedited.
Question:
What is the primary use of the PXIe-6570 instrument?
Answer:
The PXIe-6570 is designed for semiconductor portrayal and production tests, offering a high performance of 100 MVector/s.
Question:
How can customers identify the PXIe-6570?
Answer:
The PXIe-6570 has a part number, 785283-01, which allows customers to easily identify and order the specific instrument they need.
Question:
What are some of the key features of the PXIe-6570's included tools?
Answer:
The PXIe-6570 includes a digital pattern editor for creating and managing test patterns, a Shmoo tool for device performance characterization, and a digital scope for visual signal waveforms. Additional viewers are available for History RAM, pin states, and framework states.
Question:
What systems is the PXIe-6570 compatible with?
Answer:
The PXIe-6570 is compatible with the NI PXI platform and the NI Semiconductor Test System (STS), ensuring seamless integration with existing systems.
Question:
Why is the PXIe-6570 a reliable option for semiconductor testing?
Answer:
The PXIe-6570 is designed to be flexible and adaptable to different testing environments, making it a versatile and reliable option for semiconductor testing needs.